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Shimoyama, Iwao; Baba, Yuji; Hirao, Norie*
Advances in Engineering (Internet), 1 Pages, 2018/02
The performance of organic devices largely depends on molecular orientation in organic films. Whereas micro-orientation control of organic molecules is an indispensable technology for integration of organic devices, the method has not been established. We attempted to control micro-orientation of polydimethylsilane (PDMS) thin films by deposition of PDMS on graphite substrates modified by hetero atom doping using ion beam. Polarization dependence measurements of X-ray absorption spectroscopy and molecular orbital calculations clarified that PDMS films have lying, standing, and random orientations on the non irradiated, N
-irradiated, and Ar-irradiated graphite surfaces, respectively. Furthermore, photoemission microscopy observation clarified that a PDMS film showed micro-patterns on a graphite surface with a microstructure on the order of 
m by separating N-irradiated and non irradiated areas. These results demonstrate our method is promising for micro-orientation of organic molecules.
Shimoyama, Iwao; Baba, Yuji; Hirao, Norie*
no journal, ,
Polysilane has one-dimensional semiconducting electronic structure. Although the electronic property of polysilane thin film depends on orientation structure, the micro-orientation control method has not been established. We attempted orientation control for polydimethylsilane (PDMS) thin films by surface modification of graphite substrate using ion beam irradiation. Whereas PDMS thin film had flat-lying orientation on non irradiated graphite, random orientation was formed on Ar-irradiated graphite. And, we found that PDMS thin film had standing orientation on N-irradiated graphite using near edge X-ray absorption fine structure spectroscopy. Furthermore, we deposited PDMS thin film on a graphite substrate which was irradiated by N ion beam through a grid with of 25m periodicity and observed that the orientation structure of the PDMS thin film depended on the irradiated pattern using photoelectron emission microscopy. Based on these results, we concluded our method is available for micro-orientation control of polysilane films.